Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of aqueous solutions
نویسندگان
چکیده
منابع مشابه
Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of aqueous solutions.
A retroreflection (return-path) spectroscopic ellipsometer without a wave plate is described that uses an IR-transparent high-refractive-index hemicylindrical semiconductor substrate to measure the optical properties of aqueous solutions from multiple principal angles and multiple principal azimuths of attenuated internal reflection (AIR) at the semiconductor-solution interface. The pseudo-Brew...
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ژورنال
عنوان ژورنال: Applied Optics
سال: 2010
ISSN: 0003-6935,1539-4522
DOI: 10.1364/ao.49.004710